发明名称 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING MATRIX SUBSTRATE OF THIN FILM TRANSISTOR, AND LIGHT EXPOSURE MASK
摘要 There is provided a patterning method which makes it possible to form a desired preferable pattern having no reduction in the pattern thickness in a boundary portion where a group of patterns are joined using a plurality of exposure masks. There is provided a patterning method for forming a group of patterns in which first patterns to serve as basic units are repetitively arranged using a plurality of exposure masks. When a third region sandwiched by a first region exposed with a first exposure mask and a second region exposed with a second exposure mask is exposed with the first and second exposure masks in a complementary manner, repetitive unit patterns for exposing the third region are different from the first patterns.
申请公布号 KR100658123(B1) 申请公布日期 2006.12.15
申请号 KR20010058015 申请日期 2001.09.19
申请人 发明人
分类号 G02F1/136;G02F1/1368;G03F1/08;G03F1/68;G03F1/70;G03F7/20;H01L21/027;H01L21/336;H01L29/786 主分类号 G02F1/136
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