发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device comprises a semiconductor substrate, an interlayer insulating film including a first insulating film formed above the substrate and having a relative dielectric constant smaller than 2.5 and a second insulating film formed to cover the first insulating film and having a relative dielectric constant larger than that of the first insulating film, and a buried wiring formed within the interlayer insulating film. A bottom portion of the second insulating film is buried in the first insulating film at a number of points.
申请公布号 US7144804(B2) 申请公布日期 2006.12.05
申请号 US20040022644 申请日期 2004.12.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MINAMIHABA GAKU;FUKUSHIMA DAI;TATEYAMA YOSHIKUNI;YANO HIROYUKI
分类号 H01L21/4763;H01L21/768;H01L23/522;H01L23/532 主分类号 H01L21/4763
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