发明名称 |
Mixed signal delay locked loop characterization engine |
摘要 |
A mixed signal delay locked loop characterization technique for automatically characterizing a mixed signal delay locked loop is provided. The technique tests the mixed signal delay locked loop using a top-down approach in order to ensure the robustness of the mixed signal delay locked loop. Top-level testing involves testing the performance of the mixed signal delay locked loop in different process corners, and the results obtained from the top-level testing are then used to test sub-components of the mixed signal delay locked loop.
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申请公布号 |
US7136799(B2) |
申请公布日期 |
2006.11.14 |
申请号 |
US20030394789 |
申请日期 |
2003.03.21 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
CHONG KIAN;LIU DEAN;GAUTHIER CLAUDE R. |
分类号 |
G06F13/00;H03L7/06;H03L7/081 |
主分类号 |
G06F13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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