发明名称 Semiconductor device, driving method and inspection method thereof
摘要 For an inspection of a display device which incorporates a driver circuit around pixels, a start pulse and a clock pulse are required to be inputted as inspection signals. The more complex the driver circuit is, the more complexity the start pulse and the clock pulse tend to have, which will increase the manufacturing cost of inspection signals. In addition, since a clock generator is required, cost of an inspection device is increased. Furthermore, it will lead to a longer inspection time. By setting all the power supplies for the driver circuit at a desired potential, a desired potential is outputted regardless of an input signal.
申请公布号 US7132842(B2) 申请公布日期 2006.11.07
申请号 US20030740605 申请日期 2003.12.22
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MIYAGAWA KEISUKE
分类号 G01R31/28;G09G3/00;G09G3/20;G11C7/00 主分类号 G01R31/28
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