| 摘要 |
A defect detecting method of a light emitting display is provided to detect whether defective pixels are included in the light emitting display or not by measuring the leak current flowing in light emitting elements while applying inverse voltage to the light emitting elements. A defect detecting method of a light emitting display includes the steps of: producing the light emitting display displaying an image by pixels having a light emitting element(OLED) and a pixel circuit; applying inverse voltage to the light emitting element; and detecting defects of the light emitting display by measuring the leak current flowing in light emitting element. The pixel comprises the light emitting element; a first transistor(M1) generating driving current by voltage applied to a gate; a second transistor(M2) transmitting a data signal by a first scan signal; a capacitor(Cst) storing voltage corresponding to the difference between a first power source(ELVdd) and the data signal and transmitting the voltage to the gate of the first transistor; a third transistor(M3) diode-connected to the capacitor to transmit the data signal; a fourth transistor(M4) initializing the capacitor by transmitting an initialization signal to the capacitor by a second scan signal; and a fifth transistor(M5) transmitting driving current to the light emitting element by the second scan signal.
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