发明名称 Method and apparatus for forming a thin semiconductor film, method and apparatus for producing a semiconductor device, and electro-optical apparatus
摘要 A method is disclosed for forming high-quality high-crystallinity polycrystalline or monocrystalline thin semiconductor film. The method is capable of forming such a semiconductor film over a large area at low cost. An apparatus for practicing the method is also disclosed. To form a high-crystallinity large-grain polycrystalline film or monocrystalline thin semiconductor film on a substrate, or to produce a semiconductor device including a high-crystallinity large-grain polycrystalline film or monocrystalline thin semiconductor film disposed on a substrate, a low-crystal-quality thin semiconductor film is first formed on the substrate, and then focused-light annealing is performed on the low-crystal-quality thin semiconductor film thereby melting or semi-melting the low-crystal-quality thin semiconductor film. The focused-light annealing allows enhancement of crystallization that occurs when the melted low-crystal-quality thin semiconductor film is cooled, and thus the low-crystal-quality thin semiconductor film is converted into a high-quality polycrystalline (or monocrystalline) thin semiconductor film.
申请公布号 US7098085(B2) 申请公布日期 2006.08.29
申请号 US20020075774 申请日期 2002.02.14
申请人 SONY CORPORATION 发明人 YAMANAKA HIDEO;YAMOTO HISAYOSHI
分类号 G02F1/1368;H01L21/00;C23C16/44;G09F9/30;H01J9/02;H01L21/20;H01L21/205;H01L21/26;H01L21/336;H01L21/461;H01L21/77;H01L21/84;H01L27/12;H01L29/786;H01L31/04 主分类号 G02F1/1368
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