| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device, an inspection system, and an inspection method of an analog voltage output device capable of shortening inspection time. SOLUTION: An inspection circuit W1 of the analog voltage output device comprises a comparator 14 for comparing a selection voltage (a) that is output from a source driver 21 before and after a voltage selection instruction is changed; an exclusive OR element 17 for determining whether the value of the selection voltage (a) that is output from the source driver 21 is appropriately switched according to the change of the voltage selection instruction, by comparing the comparison result by the comparator 14 with ideal comparison results; a determination result storage 18 for storing results determined by the exclusive OR element 17; and an AND element 19 for inhibiting storage into the determination result storage 18 thereafter when the determined results, where the value of the voltage output from the source driver 21 is not appropriately switched according to the change of the voltage selection instructions, are stored into the determination result storage 18 once. COPYRIGHT: (C)2006,JPO&NCIPI
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