发明名称 MICRO-FEATURE FILL PROCESS AND APPARATUS USING HEXACHLORODISILANE OR OTHER CHLORINE-CONTAINING SILICON PRECURSOR
摘要 <p>A method is provided for depositing a silicon-containing film in a micro-feature on a substrate by a low pressure deposition process in a processing system. A silicon-containing film can be formed in a micro-feature by providing a substrate in a process chamber of a processing system, and exposing a hexachiorodisilane (HCD) process gas to the substrate. A processing tool containing a processing system for forming a silicon-containing film in a micro-feature using a silicon and chlorine-containing gas such as a HCD process gas is provided. Alternatively, the micro-feature can be exposed to DCS, SiCl<SUB>4</SUB>, and SiHCI<SUB>3</SUB> gases. Alternatively, the micro-feature can be exposed to (SiH<SUB>4</SUB> +HCI).</p>
申请公布号 WO2006078354(A2) 申请公布日期 2006.07.27
申请号 WO2005US43027 申请日期 2005.11.30
申请人 TOKYO ELECTRON LIMITED;LEITH, ALLEN;DIP, ANTHONY;OH, SEUNGHO 发明人 LEITH, ALLEN;DIP, ANTHONY;OH, SEUNGHO
分类号 H01L21/8234 主分类号 H01L21/8234
代理机构 代理人
主权项
地址