发明名称 Lock-out device and semiconductor integrated circuit device including the same
摘要 A lock-out device is provided that determines whether to lock out a chip or not according to the result of operation voltage drop detected at a plurality of positions in a semiconductor integrated circuit device. As a result, unnecessary lock-out operations can be prevented and a program operation or an erase operation in a semiconductor memory device can be executed stably.
申请公布号 US2006142963(A1) 申请公布日期 2006.06.29
申请号 US20050243741 申请日期 2005.10.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWAK PAN-SUK
分类号 G01R19/00 主分类号 G01R19/00
代理机构 代理人
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