发明名称 Photomask, method for producing the same, and method for forming pattern using the photomask
摘要 A mask pattern to be provided on a transparent substrate 2 includes a semi-light-shielding portion 3 which transmits exposure light in the same phase as that of the light-transmitting portion 4 and a phase shifter 5 which transmits exposure light in a phase opposite to that of the light-transmitting portion 4 . The semi-light-shielding portion 3 has a transmittance which allows exposure light to be partially transmitted. The phase shifter 5 is provided in a region of the mask pattern in which light transmitted through the phase shifter 5 can cancel part of the light transmitted through the light-transmitting portion 4 and the semi-light-transmitting portion 3.
申请公布号 US7060398(B2) 申请公布日期 2006.06.13
申请号 US20030474336 申请日期 2003.10.08
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MISAKA AKIO
分类号 G01F9/00;G03F1/00;G03F1/14;G03F1/29;G03F1/32;G03F1/36;G03F1/68 主分类号 G01F9/00
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