A GALVANOMETER FOR ANALYZING A QUALITY OF OLED PANEL,申请号KR20050030367-传众专利搜索

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发明名称	A GALVANOMETER FOR ANALYZING A QUALITY OF OLED PANEL
摘要
申请公布号	KR100591165(B1)	申请公布日期	2006.06.12
申请号	KR20050030367	申请日期	2005.04.12
申请人	KOO, JA HOI	发明人	KOO, JA HOI
分类号	G01R19/00;G01R31/00;G09G3/30	主分类号	G01R19/00
代理机构		代理人
主权项
地址

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