test pattern of semiconductor device and test method using the same,申请号KR20040004378-传众专利搜索

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发明名称	test pattern of semiconductor device and test method using the same
摘要
申请公布号	KR100583960(B1)	申请公布日期	2006.05.26
申请号	KR20040004378	申请日期	2004.01.20
申请人		发明人
分类号	G01R31/02;H01L21/66;G01R31/28;H01L21/822;H01L27/04	主分类号	G01R31/02
代理机构		代理人
主权项
地址

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