发明名称 INFRARED DETECTION MATERIAL AND METHOD OF PRODUCTION
摘要 <p>A thin film quaternary compound semiconductor comprising arsenic (As), selenium (Se), tellurium (Te) and copper (Cu) atoms with adjustable molar concentrations during processing, whose atomic arrangement is predominantly amorphous, glassy or polycrystalline, and dominated by covalent chemical bonds between the said atoms. The amorphous nature of the atomic arrangement give predominance to short range atomic order, eliminating the constraints of lattice constant mismatch and polarity mismatch with the substrate, which opens the way to wide chemical compositional adjustments and to lower-cost deposition processes such as thermal evaporation or sputtering.</p>
申请公布号 WO2006044982(A1) 申请公布日期 2006.04.27
申请号 WO2005US37632 申请日期 2005.10.17
申请人 MASSACHUSETTS INSTITUTE OF TECHNOLOGY;VIENS, JEAN, FRANCOIS;HU, JUEJUN;VIENS, FERNAND, ADRIEN;AGARWAL, ANURADHA, M.;KIMERLING, LIONEL, G. 发明人 VIENS, JEAN, FRANCOIS;HU, JUEJUN;VIENS, FERNAND, ADRIEN;AGARWAL, ANURADHA, M.;KIMERLING, LIONEL, G.
分类号 H01L31/032 主分类号 H01L31/032
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