发明名称 ELECTRON MICROSCOPE FOR PERFORMING AUTOMATIC YOUNG'S FRINGE PHOTOGRAPHING
摘要 PROBLEM TO BE SOLVED: To provide a device for easily photographing a reliable double exposure image, when measuring the information limit of a transmission type electron microscope by using a Young's fringe method. SOLUTION: Conditions required for Young's fringe method photographing are stored in a storage 26 in advance. When the Young's fringe method photographing is selected, conditions required for photographing, such as the amount of the deviation of an electron microscope image, an exposure time, and the number of repetitions of deflection, are read from the storage 26 and are set to the device. A deflection coil 9 is controlled based on the photographing conditions, and the Young's fringe method photographing is performed automatically. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006107923(A) 申请公布日期 2006.04.20
申请号 JP20040292842 申请日期 2004.10.05
申请人 JEOL LTD 发明人 SAWADA HIDEAKI;TOMITA TAKESHI
分类号 H01J37/26;H01J37/22 主分类号 H01J37/26
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