发明名称 METHOD AND DEVICE FOR A THERMOANALYTICAL MATERIAL ANALYSIS
摘要 Method for material examination in which the material is acted on by an excitation value, which causes a resultant response. A resultant time series of excitation values and measurement values are evaluated. The evaluation is undertaken using a mathematical model that has a finite number of parameters and that describes the relationship between excitation and response. The model parameters are determined from the time series of excitation and response measurement values. The invention also relates to a corresponding device for implementation of the inventive method.
申请公布号 EP1644844(A1) 申请公布日期 2006.04.12
申请号 EP20040766116 申请日期 2004.07.02
申请人 METTLER-TOLEDO GMBH 发明人 HUETTER, THOMAS;HEITZ, CHRISTOPH;SCHAWE, JUERGEN
分类号 G01D1/00;G01N25/48 主分类号 G01D1/00
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