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发明名称
METHOD OF MANUFACTURING A PROBE FOR VALUATION OF A GATE OXIDE QUALITY AND VALUATION METHOD OF A GATE OXIDE QUALITY USING THE SAME
摘要
申请公布号
KR20060029380(A)
申请公布日期
2006.04.06
申请号
KR20040078295
申请日期
2004.10.01
申请人
HYNIX SEMICONDUCTOR INC.
发明人
SHIN, WAN SUP
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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