发明名称 |
POSITIVE RESIST COMPOSITION FOR LIQUID IMMERSION EXPOSURE AND METHOD FOR FORMING PATTERN BY USING SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a resist suitable for liquid immersion exposure that is less in the deterioration in sensitivity as compared with dry exposure when applied to liquid immersion exposure, and extremely low in elution of an acid to an immersion liquid. <P>SOLUTION: The positive resist composition for liquid immersion exposure comprises: (A) a resin containing contains at least one kind of repeating unit having a fluorine atom and increasing a solubility of the resin in an alkali developing liquid by an action of an acid; and (B) a compound capable of generating an acid upon irradiation with actinic rays or radiation. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006079048(A) |
申请公布日期 |
2006.03.23 |
申请号 |
JP20050045654 |
申请日期 |
2005.02.22 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
INABE HARUKI;KANNA SHINICHI;KANDA HIROMI |
分类号 |
G03F7/039;C08F16/22;C08F20/26;C08F32/08;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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