发明名称 System for handling of wafers within a process tool
摘要 A semiconductor process tool having a dual angled loadlock system, wherein a substrate path through each of the loadlock chambers is angled and biased toward one side through a gate valve. A wafer handling chamber is in selective communication with the loadlock chambers. The wafer handling chamber has a robot that is capable of accessing substrates in both of the loadlock chambers. A gate valve includes an insert within a wall separating the wafer handling chamber from one of the loadlocks, and a valve seat mounted on the insert and protruding into the wafer handling chamber.
申请公布号 US2006045668(A1) 申请公布日期 2006.03.02
申请号 US20050184511 申请日期 2005.07.18
申请人 GRABOWSKI AL W 发明人 GRABOWSKI AL W.
分类号 H01L21/00 主分类号 H01L21/00
代理机构 代理人
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