发明名称 MEMORY DEVICE WITH SENSE AMPLIFIER AND SELF-TIMED LATCH
摘要 A memory device (201) includes a plurality of memory cells (203), bit lines, word lines, a sense amplifier (314), and a self-timed latch (215). The sense amplifier (314), responsive to a sense enable signal, is for sensing and amplifying a voltage on the bit lines corresponding to a stored logic state of a selected one of the plurality of memory cells. An isolation circuit (306, 308) is coupled between the bit lines (205 and 207) and the sense amplifier (314). The isolation circuit (306, 308) is for decoupling the selected one of the plurality of memory cells from the sense amplifier (314) at about the same time that the sense enable signal is asserted. A self-timed latch (215) is coupled to the sense amplifier (314). The self- timed latch (215) does not receive a clock signal and is responsive to only the amplified voltage.
申请公布号 KR20060002967(A) 申请公布日期 2006.01.09
申请号 KR20057019216 申请日期 2004.04.08
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 PALMER JEREMIAH T. C.;PELLEY III PERRY H.
分类号 G11C7/06;G11C11/00;G11C11/419 主分类号 G11C7/06
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