发明名称 Method and structure for improved trench processing
摘要 A method is provided for making a trench capacitor by forming a trench in a substrate. The trench is then widened and a sacrificial collar is formed on sidewalls of the widened trench. The trench is then vertically deepened to extend below the sidewalls of the sacrificial collar. Subsequently, a capacitor is formed in the trench below the sacrificial collar. An integrated circuit includes a deep trench structure formed in a single-crystal region of a semiconductor substrate including an upper trench portion, the upper trench portion having an opening of rectangular shape. A lower trench portion is formed below the upper trench portion. The lower portion may be widened to have a bottle shape. Alternatively, the upper trench portion may be widened relative to the lower trench portion.
申请公布号 US6967136(B2) 申请公布日期 2005.11.22
申请号 US20030604594 申请日期 2003.08.01
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 AKATSU HIROYUKI;CHENG KANGGUO;SETTLEMYER KENNETH
分类号 H01L21/20;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/20
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