发明名称 Trimming functional parameters in integrated circuits
摘要 A trimming structure for trimming functional parameters of an Integrated Circuit-IC-( 100 ) includes a first ( 115 a) and at least one second functional blocks ( 115 b, . . . , 115 n) with which a first (Vrg,a) and at least one second IC functional parameters (Vrg,b, . . . ,Vrg,n) are respectively associated. The trimming structure includes respective trimmable circuit structures ( 205 a, 210 a, . . . , 205 n, 210 n) included in the first and at least one second functional blocks, and trimming configuration storage ( 110 ) for storing trimming configurations for the trimmable circuit structures. A change in the trimming configuration of the first functional block causes a corresponding change in the trimming configuration of the second functional block. Further, a change in the second IC functional parameter in response to the corresponding change in the trimming configuration of the second functional block is proportional to the change in the first IC functional parameter consequent to the change in the trimming configuration of the first functional block.
申请公布号 US2005253644(A1) 申请公布日期 2005.11.17
申请号 US20050113818 申请日期 2005.04.25
申请人 STMICROELECTRONICS S.R.I. 发明人 CRIPPA LUCA;SANGALLI MIRIAM;SCOMMEGNA SALVATRICE;MICHELONI RINO
分类号 G05F3/30;G11C5/14;G11C29/02;H03H11/26;(IPC1-7):H03H11/26 主分类号 G05F3/30
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