发明名称 SEMICONDUCTOR MEMORY DEVICE, AND METHOD FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device which is excellent in element isolation property and whose capacitor capacity is large. <P>SOLUTION: The semiconductor memory device is provided with a semiconductor substrate 1 including a separating recess 4, a capacitor oxide film 12b which is formed on at least a part of the side surface of the separating recess 4, a separating oxide film 35 which is formed in the separating recess 4 and formed so that at least a part of the film 35 is isolated from the capacitor oxide film 12b, and a capacitor gate 15 which is formed so that the separating recess 4 is filled with the gate 15 and has an interposer 30 which is clamped with the separating oxide film 35 and the capacitor oxide film 12b. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005311173(A) 申请公布日期 2005.11.04
申请号 JP20040128186 申请日期 2004.04.23
申请人 RENESAS TECHNOLOGY CORP 发明人 FUJIISHI YOSHITAKA
分类号 H01L21/76;H01L21/8242;H01L27/108 主分类号 H01L21/76
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