发明名称 |
Test method and apparatus for verifying fabrication of transistors in an integrated circuit |
摘要 |
A ring oscillator for a test apparatus and method for verifying fabrication of transistors in an integrated circuit on a die under test is implemented. The ring oscillator is fabricated on the die and includes a positive feedback loop between a circuit output terminal and a feedback input terminal. The feedback loop includes a plurality of delaying stages connected in cascade. A transfer gate is coupled to each delaying stage. Each of the transfer gates includes a pair of transistors of the first and second conductivity types connected in parallel. The ring oscillator is operable to provide a first oscillator output signal during a first test mode when the transistors of the first conductivity type are ON and the transistors of the second conductivity type are OFF. The ring oscillator is operable to provide a second oscillator output signal during a second test mode when the transistors of the first conductivity type are OFF and the transistors of the second conductivity type are ON. The ring oscillator is operable to provide a third oscillator output signal during a third test mode when the transistors of the first conductivity type are ON and the transistors of the second conductivity type are ON.
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申请公布号 |
US6958659(B2) |
申请公布日期 |
2005.10.25 |
申请号 |
US20030649833 |
申请日期 |
2003.08.28 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
NAKAJIMA KAZUHIRO |
分类号 |
H03K3/354;G01R31/27;H03K3/03;(IPC1-7):H03B25/00;G01R31/02 |
主分类号 |
H03K3/354 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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