发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device exhibiting excellent reliability and manufacture stability. SOLUTION: The semiconductor device 100 comprises a semiconductor substrate 102 having a contact hole opening to one and the other surfaces, a solder ball 116 provided on one surface of the semiconductor substrate 102, an electrode 106 provided on the other surface of the semiconductor substrate 102, rewiring 110 for connecting the solder ball 116 with an electrode 106 provided at least partially in the contact hole of the semiconductor substrate 102, and a laminate type photosolder resist film 114 at least a part of which is provided in a part of the contact hole of the semiconductor substrate 102 and on one surface of the semiconductor substrate 102 wherein the laminate type photosolder resist film 114 contains cardo type polymer. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005294320(A) 申请公布日期 2005.10.20
申请号 JP20040103218 申请日期 2004.03.31
申请人 SANYO ELECTRIC CO LTD 发明人 USUI RYOSUKE;OKAYAMA YOSHIHISA
分类号 H01L23/52;H01L21/312;H01L21/3205;H01L21/60;H01L21/768;H01L23/12;H01L23/522;(IPC1-7):H01L23/12;H01L21/320 主分类号 H01L23/52
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