发明名称 Methods of forming bumps using barrier layers as etch masks and related structures
摘要 Forming an electronic structure may include forming a seed layer on a substrate, and forming a mask on the seed layer. The mask may include an aperture therein exposing a portion of the seed layer, and a barrier layer may be formed on the exposed portion of the seed layer. A bump may be formed on the barrier layer, and the mask may be removed. In addition, portions of the seed layer may be selectively removed using the barrier layer as an etch mask.
申请公布号 US2005215045(A1) 申请公布日期 2005.09.29
申请号 US20050075474 申请日期 2005.03.09
申请人 发明人 RINNE GLENN A.;MIS J. D.
分类号 H01L21/44;H01L21/60;H01L23/485;H05K3/06;H05K3/24;(IPC1-7):H01L21/44 主分类号 H01L21/44
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