Scanning probe microscope for use in life sciences, material science and nano-physics has an additional reaction chamber in which a sample carrier can be place and which can be accessed from above by the microscope probe

摘要

Scanning probe microscope comprises a base frame (11) with a probe holder (12), a probe (13) and a sample carrier (14). Probe and sample can be moved relative to each other so that the probe can collect information relating to the sample surface. A reaction chamber (16) can be mounted on the base frame of the microscope. The sample carrier is arranged within it. The chamber has an opening (17) on the probe side so that the probe can be lowered into the reaction chamber. An independent claim is made for a method for processing and examining surfaces with the help of a probe of a scanning probe microscope.