SCANNING ILLUMINATION SYSTEM FOR OPTICAL MEASUREMENT OF CRACK, SCRATCH, MICRO DEFORMATION WITH TIME CONTROLLING,申请号KR20050060990-传众专利搜索

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发明名称	SCANNING ILLUMINATION SYSTEM FOR OPTICAL MEASUREMENT OF CRACK, SCRATCH, MICRO DEFORMATION WITH TIME CONTROLLING
摘要
申请公布号	KR20050080063(A)	申请公布日期	2005.08.11
申请号	KR20050060990	申请日期	2005.07.07
申请人	YIM, NOH BIN	发明人	YIM, NOH BIN
分类号	G01N21/88;(IPC1-7):G01N21/88	主分类号	G01N21/88
代理机构		代理人
主权项
地址

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