发明名称 APPARATUS AND METHOD OF REMOVING RESIST
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method of removing a resist which can remove the resist with good production efficiency while preventing the resist from being retained certainly. SOLUTION: In the apparatus for removing the resist formed on a substrate by a chemical treatment and the method of removing the resist using the apparatus, an analyzing means for analyzing the composition of the chemical is provided in a chemical circulating route. The analyzing means includes preferably a measuring means of a resist ingredient concentration and/or a measuring means of a resist treatment agent concentration, and performs the control of the chemical treating condition in a real time according to output data transferred from the analyzing means. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005191030(A) 申请公布日期 2005.07.14
申请号 JP20030426744 申请日期 2003.12.24
申请人 SHARP CORP 发明人 SUNAKAWA YOSHIYUKI
分类号 G03F7/42;H01L21/027;H01L21/304;(IPC1-7):H01L21/027 主分类号 G03F7/42
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