发明名称 |
Method for automatically searching for functional defects in a description of a circuit |
摘要 |
A programmed computer searches for functional defects in a description of a circuit undergoing functional verification in the following manner. The programmed computer simulates the functional behavior of the circuit in response to a test vector, automatically restores the state of the simulation without causing the simulation to pass through a reset state, and then simulates the functional behavior of the circuit in response to another test vector. A predetermined rule can be used to identify test vectors to be simulated, and the predetermined rule can depend upon a measure of functional verification, including the number of times during simulation when a first state transition is performed by a first-controller at the same time as a second state transition is performed by a second controller. During simulation of the test vectors, manually generated tests or automatically generated checkers can monitor portions of the circuit for defective behavior.
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申请公布号 |
US2005131665(A1) |
申请公布日期 |
2005.06.16 |
申请号 |
US20050035275 |
申请日期 |
2005.01.12 |
申请人 |
HO CHIAN-MIN R.;MARDJUKI ROBERT K.;DILL DAVID L.;LIN JING C.;YEUNG PING F.;ESTRADA PAUL I.;GIOMI JEAN-CHARLES;LY TAI A.;MULAM KALYANA C.;WIDDOES LAWRENCE C.JR.;WILCOX PAUL A. |
发明人 |
HO CHIAN-MIN R.;MARDJUKI ROBERT K.;DILL DAVID L.;LIN JING C.;YEUNG PING F.;ESTRADA PAUL I.;GIOMI JEAN-CHARLES;LY TAI A.;MULAM KALYANA C.;WIDDOES LAWRENCE C.JR.;WILCOX PAUL A. |
分类号 |
G01R31/3183;(IPC1-7):G06F17/50 |
主分类号 |
G01R31/3183 |
代理机构 |
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