发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device operating at a high-speed with the conventional semiconductor device driving voltage sustained as it is, and also to provide a method for manufacturing the same. SOLUTION: A semiconductor layer 17 is formed on an n<SP>-</SP>epitaxial layer 2 formed on a silicon substrate 1. A trench 6 is formed extending through the semiconductor layer 17 and stopping at the middle of the thickness of the n<SP>-</SP>epitaxial layer 2. The semiconductor layer 17 contains a p<SP>-</SP>region 3 having a specified thickness, and the trench 6 penetrates through the p<SP>-</SP>region 3. An oxide film 7 made of silicon oxide is formed to cover the internal wall of the trench 6. A polysilicon layer 8 is arranged to fill up the vacancy in the trench 6 to a specified level. On the polysilicon layer 8, a low-resistance layer 9 is formed, mainly composed of a metal element that constitutes a gate electrode 10 in collaboration with the polysilicon layer 8. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005150475(A) 申请公布日期 2005.06.09
申请号 JP20030387066 申请日期 2003.11.17
申请人 ROHM CO LTD 发明人 YOSHIMOCHI KENICHI
分类号 H01L21/28;H01L21/336;H01L21/338;H01L27/148;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/28
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