发明名称 Module-testing device
摘要 A wiring pattern circuit includes part of wiring between a module control circuit and a module. Since the wiring pattern circuit includes a PLD, the wiring thereof can be variably configured in accordance with the specifications of the module control circuit and the module. The construction of the module control circuit can be therefore facilitated. In addition, since a printed wiring pattern does not have to be provided separately for the test of each of a plurality of different modules, the test period, the labor and the cost involved during the test can be decreased.
申请公布号 US2005119872(A1) 申请公布日期 2005.06.02
申请号 US20040507846 申请日期 2004.09.15
申请人 NAKAYA KAZUYOSHI 发明人 NAKAYA KAZUYOSHI
分类号 G01R31/28;G01R31/319;G06F11/22;(IPC1-7):G06F9/455 主分类号 G01R31/28
代理机构 代理人
主权项
地址