发明名称 Prevention of contamination on bonding pads of wafer during SMT
摘要 A semiconductor device is disclosed for preventing contamination on its bonding pads during mounting an electronic component, such as surface mount device (SMD). The semiconductor device includes a semiconductor substrate, a plurality of jointing material and at least an electronic component. A plurality of first bonding pads for wire-bonding and a plurality of second bonding pads for mounting the electronic component are formed on the active surface of the substrate. The substrate includes at least a dam is formed on the active surface to separate the first bonding pads from the second bonding pads. Preferably, the dam surrounds the second bonding pads. The jointing material is disposed on the second bonding pads for bonding the electronic component. Using the dam, there is no flux or tin-lead solder flowing onto the first bonding pads during reflowing the jointing material. In an embodiment, the electronic component can be mounted on the substrate in a wafer level.
申请公布号 US2005082682(A1) 申请公布日期 2005.04.21
申请号 US20040968053 申请日期 2004.10.20
申请人 ADVANCED SEMICONDUCTOR ENGINEERING, INC. 发明人 LIU SHENG-TSUNG
分类号 H01L23/00;H01L23/485;H05K3/34;(IPC1-7):H01L21/48;H01L29/40 主分类号 H01L23/00
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