| 摘要 |
The invention provides a test apparatus for testing circuit units (101a-101k) to be tested by means of a test system (100), having a connection device (102), tester channels (103a-103m) for connecting the test system (100) to the connection device (102) and receptacle units (104a-104k), having a number (n1, n2, . . . , nk) of circuit unit data channels dependent on the circuit units (101-101k) to be tested, provision being made of a changeover device (200) for changing over the tester channels (103a-103m) to the receptacle units (104a-104k), and it being possible to divide a number (m) of tester channels (103a-103m) between the number (n1, n2, . . . , nk) of circuit unit data channels in a predeterminable manner.
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