发明名称 HIGHLY RELIABLE PACKAGE
摘要 <P>PROBLEM TO BE SOLVED: To solve a following problem that a connection part between a semiconductor device and a copper pattern on a base material is easily broken due to temperature change since the semiconductor device and a substrate are different in thermal expansion coefficient in a semiconductor package. <P>SOLUTION: A flexible substrate is adhered on a mold, which is a base material formed of a resin, by means of an adhesive or an adhesive sheet. A semiconductor is subjected to flip chip packaging on the flexible substrate and stress due to heat shrinkage is relaxed by the flexible sheet and the adhesive or the adhesive sheet. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005086044(A) 申请公布日期 2005.03.31
申请号 JP20030317570 申请日期 2003.09.09
申请人 CITIZEN ELECTRONICS CO LTD 发明人 SASUGA MASATOSHI
分类号 H01L21/56;H01L21/58;H01L21/60;H01L23/12;H01L23/13;H01L33/60;H01L33/62 主分类号 H01L21/56
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