发明名称 |
Method for generating test signals for an integrated circuit and test logic unit |
摘要 |
To generate test signals by a test logic unit on a semiconductor wafer, the test signals being used to check specific functions and/or parameters of an integrated circuit on the semiconductor wafer, at least two test signals are provided substantially simultaneously by the test logic unit and are subsequently serialized to generate a multiplexed test signal sequence with a data rate required for testing.
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申请公布号 |
US6870392(B2) |
申请公布日期 |
2005.03.22 |
申请号 |
US20030368330 |
申请日期 |
2003.02.18 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
KILIAN VOLKER;ROTH RICHARD |
分类号 |
G01R31/319;G11C29/36;(IPC1-7):H03K19/173 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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