发明名称 Method of production of a patterned semiconductor layer
摘要 The present invention relates to a method for the production of semiconductor components. This method comprises the steps of applying masking layers and components on epitaxial semiconductor substrates within the epitaxy reactor without removal of the substrate from the reactor. The masking layers may be HF soluble such that a gas etchant may be introduced within the reactor so as to etch a select number and portion of masking layers. This method may be used for production of lateral integrated components on a substrate wherein the components may be of the same or different type. Such types include electronic and optoelectronic components. Numerous masking layers may be applied, each defining particular windows intended to receive each of the various components. In the reactor, the masks may be selectively removed, then the components grown in the newly exposed windows.
申请公布号 US6864112(B1) 申请公布日期 2005.03.08
申请号 US20000722461 申请日期 2000.11.28
申请人 OSRAM OPTO SEMICONDUCTORS GMBH & CO. OHG 发明人 HAERLE VOLKER
分类号 H01L21/20;H01L21/205;H01L21/306;H01S5/02;H01S5/026;(IPC1-7):H01L21/00 主分类号 H01L21/20
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