发明名称 Semiconductor device with selectable gate thickness and method of manufacturing such devices
摘要 A method of forming layers, in the same device material, with different thickness or layer height in a semiconductor device comprises forming device material layer or gate electrode layer disposable parts in selected regions of the device layer. The disposable parts can be formed by doping the selected regions to the desired depth d. The as-deposited thickness t of this device layer can be adjusted or modulated after the patterning of the individual devices by removing the disposable parts.
申请公布号 US6855605(B2) 申请公布日期 2005.02.15
申请号 US20020286427 申请日期 2002.10.30
申请人 INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC) 发明人 JURCZAK MALGORZATA;ROOYACKERS RITA;AUGENDRE EMMANUEL;BADENES GONCAL
分类号 H01L21/28;H01L21/3215;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823;H01L21/320;H01L21/425;H01L29/76;H01L31/062 主分类号 H01L21/28
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