发明名称 |
SYSTEM AND METHOD FOR PLASMA ETCHING |
摘要 |
PROBLEM TO BE SOLVED: To suppress the attachment of foreign matters to a substrate to treat without deteriorating the etching properties in a plasma treatment to etch an organic film. SOLUTION: In a plasma etching system wherein the organic film is etched, a semiconductor ring is arranged in the periphery of the substrate to be treated and a bias voltage is applied to the ring. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005039004(A) |
申请公布日期 |
2005.02.10 |
申请号 |
JP20030199208 |
申请日期 |
2003.07.18 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
YAKUSHIJI MAMORU;OMOTO YUTAKA;FUKUYAMA RYOJI;WATANABE KATSUYA |
分类号 |
H01L21/3065;H01J37/32;H01L21/00;H01L21/311;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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