发明名称 SYSTEM AND METHOD FOR PLASMA ETCHING
摘要 PROBLEM TO BE SOLVED: To suppress the attachment of foreign matters to a substrate to treat without deteriorating the etching properties in a plasma treatment to etch an organic film. SOLUTION: In a plasma etching system wherein the organic film is etched, a semiconductor ring is arranged in the periphery of the substrate to be treated and a bias voltage is applied to the ring. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005039004(A) 申请公布日期 2005.02.10
申请号 JP20030199208 申请日期 2003.07.18
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAKUSHIJI MAMORU;OMOTO YUTAKA;FUKUYAMA RYOJI;WATANABE KATSUYA
分类号 H01L21/3065;H01J37/32;H01L21/00;H01L21/311;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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