发明名称 Field effect transistor and method of manufacturing the same
摘要 There is provided a field effect transistor including: a first insulating film formed on a semiconductor substrate, and including at least a metal oxide having a crystallinity and different in a lattice distance of a crystal on an interface from the semiconductor substrate; a convex channel region formed above the first insulating film, and different in the lattice distance from the semiconductor substrate; a source region and a drain region formed above the first insulating film on side surfaces of the channel region, respectively; a second insulating film formed right above the channel region; a gate insulating film formed on a side surface of the channel region different from the side surfaces of the channel region on which the source region and the drain regions are formed; and a gate electrode formed through the gate insulating film on at least the side surface of the channel region different from the side surfaces of the channel region on which the source region and the drain region are formed.
申请公布号 US2005017304(A1) 申请公布日期 2005.01.27
申请号 US20040863226 申请日期 2004.06.09
申请人 MATSUSHITA DAISUKE;NISHIKAWA YUKIE;SATAKE HIDEKI;FUKUSHIMA NOBURU 发明人 MATSUSHITA DAISUKE;NISHIKAWA YUKIE;SATAKE HIDEKI;FUKUSHIMA NOBURU
分类号 H01L21/336;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L27/01 主分类号 H01L21/336
代理机构 代理人
主权项
地址