发明名称 Packaging of semiconductor devices for increased reliability
摘要 A high reliability radiation shielding integrated circuit device comprising a plurality of package layers; a radiation shielding lid or base coupled to the plurality of package layers; wherein the circuit die are shielded from receiving an amount of radiation greater than the total dose tolerance of the circuit die. An integrated circuit device for use in high reliability applications. The integrated circuit device is designed to be highly reliable and protect integrated circuit die from failing or becoming unreliable due to radiation, mechanical forces, thermal exposure, or chemical contaminates.
申请公布号 US2005011656(A1) 申请公布日期 2005.01.20
申请号 US20030621844 申请日期 2003.07.16
申请人 MAXWELL TECHNOLOGIES, INC., A DELAWARE CORPORATION 发明人 PATTERSON JANET
分类号 H01L23/552;H01L25/10;(IPC1-7):H05K9/00 主分类号 H01L23/552
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