发明名称 FIELD EFFECT TRANSISTOR
摘要 <p>An electric-field moderating layer (12) and a p-type buffer layer (2) are formed on an SiC single crystal substrate (1). The electric-field moderating layer (12) is so formed between the p-type buffer layer (2) and the SiC single crystal substrate (1) that it is in contact with the SiC single crystal substrate (1). An n-type semiconductor layer (3) is formed on the p-type buffer layer (2). A p-type semiconductor layer (10) is formed on the n-type semiconductor layer (3). An n&lt;+&gt;-type source region layer (4) and an n&lt;+&gt;-type drain region layer (5) are formed at a certain distance from each other within the p-type semiconductor layer (10). A p&lt;+&gt;-type gate region layer (6) is formed in a portion of the p-type semiconductor layer (10) lying between the n&lt;+&gt;-type source region layer (4) and the n&lt;+&gt;-type drain region layer (5).</p>
申请公布号 WO2004112150(A1) 申请公布日期 2004.12.23
申请号 WO2004JP07397 申请日期 2004.05.21
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;FUJIKAWA, KAZUHIRO;HARADA, SHIN;MATSUNAMI, HIROYUKI;KIMOTO, TSUNENOBU 发明人 FUJIKAWA, KAZUHIRO;HARADA, SHIN;MATSUNAMI, HIROYUKI;KIMOTO, TSUNENOBU
分类号 H01L21/337;H01L29/06;H01L29/24;H01L29/808;(IPC1-7):H01L29/808 主分类号 H01L21/337
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