Variable clock scan test circuitry and method,申请号GB20040024893-传众专利搜索

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发明名称	Variable clock scan test circuitry and method
摘要
申请公布号	GB0424893(D0)	申请公布日期	2004.12.15
申请号	GB20040024893	申请日期	2003.06.11
申请人	ON-CHIP TECHNOLOGIES INC	发明人
分类号	G01R31/3183;G01R31/3185	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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