发明名称 |
Method of monitoring current probe transformer temperature |
摘要 |
A current probe transformer temperature monitoring method determines an initial transformer temperature of the current probe as a function of the winding resistance of the transformer. A relative temperature of the Hall Effect device is also determined as a function of resistance change of the Hall Effect device. The initial transformer temperature and the relative Hall Effect device temperature are combined to produce a continuous transformer temperature indicative of the temperature of the transformer. The current signal to the multi-turn winding is removed when the continuous transformer temperature exceeds a threshold temperature value and a visual indication may be provided.
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申请公布号 |
US6817760(B2) |
申请公布日期 |
2004.11.16 |
申请号 |
US20030667724 |
申请日期 |
2003.09.22 |
申请人 |
TEKTRONIX, INC. |
发明人 |
MENDE MICHAEL J.;DANDY JONATHAN S.;STEVENS MICHAEL D.;CRANE, JR. ALBERT S. |
分类号 |
G01K7/18;G01K7/42;(IPC1-7):G01K7/36;G01R33/00 |
主分类号 |
G01K7/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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