| 摘要 |
PROBLEM TO BE SOLVED: To accurately measure a noise level causing a DUT to fail to function normally with the DUT controlled to a desired operating state. SOLUTION: This noise tester verifies malfunction of the device under test. A pulse generation means is a noise generation source capable of performing impression of prescribed pulse noise. A pattern generation means generates a plural number M of test signals supplied to an input end of the DUT and generates a plural number N of expected value patterns. A malfunction detection means receives a plural number N of DUT output signals outputted from the DUT while receiving the value patterns outputted from the pattern generation means, and compares both the sides with each other in a prescribed manner to find whether they are in accord, outputting a malfunction signal when disaccord is detected. An overvoltage protection means protects an output end of the pattern generation means from the pulse noise impressed on the DUT while protecting an input end of the detection means from the pulse noise impressed on the DUT. COPYRIGHT: (C)2005,JPO&NCIPI
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