发明名称 |
EVENT BASED TEST METHOD FOR DEBUGGING TIMING RELATED FAILURES IN INTEGRATED CIRCUITS |
摘要 |
<p>A test method for debugging failures of an IC device with use of an event based semiconductor test system is capable of distinguishing a timing related failure from other failures. The test method includes the steps of: applying a test signal to a DUT and evaluating a response output of the DUT, detecting a failure in the response output, identifying a reference signal related to the failure, identifying a portion of the reference signal, and incrementally changing a timing of events in the portion of the reference signal to detect change in the reponse output from the DUT.</p> |
申请公布号 |
WO2004092753(A1) |
申请公布日期 |
2004.10.28 |
申请号 |
WO2004JP05041 |
申请日期 |
2004.04.07 |
申请人 |
ADVANTEST CORPORATION;PRAMANICK, ANKAN;SAWE, SIDDHARTH;RAJSUMAN, ROCHIT |
发明人 |
PRAMANICK, ANKAN;SAWE, SIDDHARTH;RAJSUMAN, ROCHIT |
分类号 |
G01R31/319;G01R31/3193;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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