EVENT TYPE SEMICONDUCTOR TEST DEVICE AND EVENT TYPE SEMICONDUCTOR TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To shorten a debugging time for a test pattern in a event type semiconductor testing device. SOLUTION: A test result is reflected in changing an event data 13 directly by providing an event correcting device 20 for changing an event condition and for adding or deleting an event, in/to/from the event data 13 and a change indication file 21. Generation of the test pattern and a test using the test pattern are carried out via no logical simulation, so as to shorten the debugging time for the test patterns. COPYRIGHT: (C)2004,JPO&NCIPI