发明名称 Examination system and examination method
摘要 An examination system and a corresponding examination method, comprise: Arranging a tissue region in a vicinity of an object plane of a microscope and generating an optical image of the tissue region, receiving tissue data from a measuring head separate from the microscope, discriminating the tissue data into at least two data categories and displaying markings in the optical image of the tissue region in dependence of the discriminated data category and a relative position between a component of the microscope and the measuring head.
申请公布号 US2004167742(A1) 申请公布日期 2004.08.26
申请号 US20030704647 申请日期 2003.11.12
申请人 CARL-ZEISS-STIFTUNG TRADING AS CARL ZEISS 发明人 HAISCH MICHAEL
分类号 G02B21/32;A61B10/00;A61B17/00;A61B19/00;G02B21/36;(IPC1-7):G01C9/00 主分类号 G02B21/32
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