发明名称 SOLUTION FOR REMOVAL OF POST DRY ETCHING RESIDUES
摘要 <p>A cleaning solution for removing post dry etching residues, the cleaning solution comprising sulfuric acid, hydrogen peroxide, a fluorine-containing compound and a surfactant. The percentage of sulfuric acid is from 1 wt% to 30wt%, the concentration of the fluorine-containing compound ranges from 1 ppm to 10000 ppm, the percentage of hydrogen peroxide is from 0.lwt% to 15wt%, and the concentration of the surfactant ranges from 1 ppm to 10000 ppm.</p>
申请公布号 WO2004067692(A1) 申请公布日期 2004.08.12
申请号 WO2003IB01720 申请日期 2003.05.02
申请人 MERCK-KANTO ADVANCED CHEMICAL LTD.;TU, SHENG-HUNG;SHEEN, WEN-SHOEI;SHEN, KWO-HUNG;TING, JACK;LI, YING-HAO;LU, CHIH-PENG 发明人 TU, SHENG-HUNG;SHEEN, WEN-SHOEI;SHEN, KWO-HUNG;TING, JACK;LI, YING-HAO;LU, CHIH-PENG
分类号 C11D3/02;C11D3/39;C11D11/00;(IPC1-7):C11D3/39;C09K13/08 主分类号 C11D3/02
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