摘要 |
<p>A cleaning solution for removing post dry etching residues, the cleaning solution comprising sulfuric acid, hydrogen peroxide, a fluorine-containing compound and a surfactant. The percentage of sulfuric acid is from 1 wt% to 30wt%, the concentration of the fluorine-containing compound ranges from 1 ppm to 10000 ppm, the percentage of hydrogen peroxide is from 0.lwt% to 15wt%, and the concentration of the surfactant ranges from 1 ppm to 10000 ppm.</p> |
申请人 |
MERCK-KANTO ADVANCED CHEMICAL LTD.;TU, SHENG-HUNG;SHEEN, WEN-SHOEI;SHEN, KWO-HUNG;TING, JACK;LI, YING-HAO;LU, CHIH-PENG |
发明人 |
TU, SHENG-HUNG;SHEEN, WEN-SHOEI;SHEN, KWO-HUNG;TING, JACK;LI, YING-HAO;LU, CHIH-PENG |