发明名称 Nonvolatile semiconductor memory device
摘要 A nonvolatile semiconductor memory device improved with integration degree, in which the gate of the selection transistors is separated on each of active regions, first and second selection transistors are arranged in two stages in the direction of the global bit line, the gates for the selection transistors in each stage are disposed on every other active regions, contact holes are formed in mirror asymmetry with respect to line B-B in the connection portion for the active regions, the gate is connected through the contact hole to the wiring, the adjacent active regions are connected entirely in one selection transistor portion and connected in an H-shape for adjacent two active regions in another selection transistor portion, and the contact hole is formed in the connection -portion and connected when the global bit line, whereby the pitch for the selection transistor portion can be decreased in the direction of the global bit line.
申请公布号 US2004076072(A1) 申请公布日期 2004.04.22
申请号 US20030682479 申请日期 2003.10.10
申请人 RENESAS TECH CORP 发明人 ARIGANE TSUYOSHI;KOBAYASHI TAKASHI;SASAGO YOSHITAKA
分类号 H01L21/8247;G11C8/02;G11C16/04;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C8/02 主分类号 H01L21/8247
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