| 摘要 |
There are disposed an output sequence control section, and output waveform data generation section for one system, and an analog waveform generation section includes four systems of ports 40, attenuators 43b for individually adjusting gains of analog test signals outputted via the respective ports, and digital/analog converters 45 for individually adjusting offset voltages of the analog test signals. Accordingly, when a plurality of LSIs to be tested are concurrently tested, the analog test signals optimized for each LSI to be tested are generated with a simple circuit configuration without complicating the circuit configuration of a performance board.
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